TFCalc is capable of simulating the output of an optical monitor, a device used during the manufacture of thin film coatings. The monitor plot displays the reflectance, transmittance, del, or psi as the thickness of a layer grows. Composite monitoring (when more than one layer is deposited on a monitor chip) can also be performed, as is illustrated in the graph below.

TFCalc allows a different monitoring ratio for each material.