Software for the Design and Manufacture of Optical Thin Film Coatings
The industry’s leading software for designing and manufacturing optical thin film coatings that won’t require you to take a class or hire an expert to use. It’s simple, it’s easy, and with our product TFCalc, you can design coatings for lenses, computer monitors, eyeglasses, window panes, light bulbs, hot and cold mirrors, x-rays mirrors.
Why TFCalc?
Easy to use
A stable, reliable tool that runs on Windows
Equipped with features required by coating designers
Equipped with features not found in other design programs
Unlimited definition of materials, substrates, and illuminants
Setting variable indices for layers, and combining multiple materials on a single layer
Endowed Chair & Professor of Optics at Monroe Community College (NY, USA)
More information about TFCalc
Can maintain the symmetry of a design while it’s being optimized.
Helps the designer locate the designs that minimize the merit function.
Utilizes needle optimization, a powerful tool in designing multilayer coatings.
Allows for needle/tunneling, so the designer has more designs from which to choose when it comes to manufacturing.
Computes EFI (electrical field intensity) to calculate performance of thin film coatings.
Utilizes Monte Carlo method to generate random designs…and then displays results!
Can compute the sensitivity of each coating layer of a design.
Can simulate the output of an optical monitor, used in the manufacturing thin film coatings.
Determines the refractive index of a thin layer coating using variable materials and fitting a dispersion formula.
All computations are done with 10-byte extended-precision numbers, which offer about four additional digits. This is important for designs having many layers.
TFCalc is a powerful program with many features. This summary is not a complete list of its capabilities. For a more complete description of TFCalc, the user manual should be read. Another way to learn about TFCalc is to run the demo version, which is available for downloading from this website.
Thin Films
Up to 5000 layers on both sides of the substrate
Layers can be added manually or created with a stack formula, such as (HL)^5 1.2(HL)^5
Layers may have a variable index
Layers may consist of mixtures of two materials
Layer thickness may be entered as physical or quarter-wave optical thickness
Layer thicknesses may be constrained
Thicknesses may be adjusted for angle
A layer may be replaced by an equivalent (HLH)^p or (LHL)^p stack
Layers may be grouped to preserve symmetry or to shift a sequence of layers
Rugate coatings can be simulated
Layers may consist of active and gain materials
Analysis
Compute reflectance, transmittance, absorptance, optical density, loss, phase shift, psi, group delay (GD), group delay dispersion (GDD), TOD, and electric field intensity
Compute reflected or transmitted color (CIE and LAB)
Compute equivalent (Herpin) index of a sequence of layers
Compute the sensitivity of reflectance, transmittance, absorptance, optical density, loss, phase shift, and color to normal manufacturing errors (thickness and index)
Compute the layer sensitivity
Compute cone-angle average (also called biconical) reflectance, transmittance, absorptance, density, and loss with user-defined radiation distributions
Interactive analysis can be used to determine how changes to one or more parameters affect the performance
Animations can be created using the interactive analysis feature
Yield analysis allows the user to determine the manufacturability of a coating
Either the Muller or Abeles phase shift convention may be selected
Simulate the output of a light monitor
Compute admittance
Optimization
Three local methods: Variable Metric, Gradient, and Simplex
Global Search may be used to find the best coating design
Needle optimization (with tunneling) may be used to synthesize unusual designs
Vary either thickness or index or both
Layer thickness can be constrained during optimization
Deviations are displayed during optimization
Index profile may be displayed during optimization
Flexible merit function
Optimize front and back layers simultaneously
Optimize group factors
Sensitivity may be optimized
Zero-thickness layers may be removed automatically during optimization
An illuminant and a detector function may be entered, making it possible to optimize a coating for specific environments
The product R*T can be optimized
Performance from both sides of a coating can be optimized
Cone-angle average may be optimized
Ultra-fast quantities (GD, GDD, TOD) may be optimized
Automatic design of bandpass filters using the prototype method
Optimization Targets
Optimization targets can be reflectance, transmittance, absorptance, density, color, luminance, phase shift, group delay, group delay dispersion, TOD, and psi at any wavelength, polarization, and angle
Targets can be either discrete (one wavelength), continuous (for a range of wavelengths), or cone-average (for a cone of angles)
First, second, and third derivatives of these quantities maybe used as targets
Targets can be entered manually, generated automatically, or read from files
Generated targets may be distributed by wavelength, wave number, or logarithmically
Target values can be inequalities
Up to 5000 targets
Targets for multiple environments
Equal-ripple targets can be generated
Target values can be entered in dB
Results
Results may be displayed numerically or graphically
All tables and graphs can be printed
Results can be saved in a file for processing by other programs
Results can be saved as an animation
Results of up to 5 coating designs can be displayed simultaneously on a graph
Two results, such as reflectance and transmittance, can be overlaid on one graph
Screen plots have a cursor that enables the designer to read numbers from the plot
Performance statistics may be computed for any result
Save plots as GIF files
Optical Data
Unlimited number of material, substrate, illuminant, detector, and radiation distribution data files
Refractive index maybe entered as tables or dispersion formulas
Internal transmittance can be read for substrates
Missing N or K data can be filled in using interpolation
Refractive index (N and K) can be computed from spectral or ellipsometric data
Material and substrate data can be absorbing and dispersive
The reflectance or transmittance of a coating can be saved as an illuminant
Comments can be stored with each data file
Data can be read from text files
Blackbody illuminants may be created
Coating Files
Contain all information about a coating — layers, targets, comments, variable materials, etc.
Easy to copy parts of one coating file to another
Export coating designs to Code V and ZEMAX optical design software
Accurate and Fast
All calculations are done in 16-digit floating-point arithmetic
During optimization, TFCalc calculates up to 500,000 layers/second on top-of-the-line computers