Focus on Special Features

• Optimization Overview
• Needle Optimization
• Needle/Tunneling Optimization
• Electric Field Intensity
• Sensitivity to Manufacturing Errors
• Layer Sensitivity
• Color Sensitivity
• Biconical Transmittance
• Optical Monitoring
• Determining Refractive Index (N and K)
• Sources of Material Data

Optical Monitoring

TFCalc is capable of simulating the output of an optical monitor, a device used during the manufacture of thin film coatings. The monitor plot displays the reflectance, transmittance, del, or psi as the thickness of a layer grows. Composite monitoring (when more than one layer is deposited on a monitor chip) can also be performed, as is illustrated in the graph below.

TFCalc allows a different monitoring ratio for each material.